Component testing device

• Main Authors: HE DONGLIN, REN XIZHOU, QU XIONGFEI, ZHANG LEI, WANG FUQUAN, FENG BO, YUAN HONGGUANG
• Format: Patent
• Language: Chinese; English
• Published: 18.09.2018
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention provides a component testing device. The device comprises a testing component, a heat exchanger, a clamping mechanism and a heat exchanger supporting mechanism, wherein the heat exchanger is used for adjusting the testing temperature of the testing component; the clamping mechanism is used for clamping the testing component and the heat exchanger; and the heat exchanger supporting mechanism is used for supporting the heat exchanger. The component testing device has a simple tool structure, small dismounting work, strong universality and light and compact structure and is convenient to test components with different types and different numbers, so that the testing efficiency is improved. 本发明提供种器件测试装置，包括测试器件、换热器、夹紧机构和换热器支撑机构；所述换热器用于调节测试器件的测试温度；所述加紧机构用于将所述测试器件和所述换热器安装加紧；所述换热器支撑机构用于支撑所述换热器。根据本发明的器件测试装置，简易工装结构，拆装量少，通用性强，结构轻便紧凑，便于安装不同种类、不同数量的器件进行测试，提高了测试效率。