Cluster measuring and controlling device for spacer layer equipment of intelligent substation

• Main Authors: GENG XIAOHUI, BAI YINGWEI, WANG YONGFU, ZHAO SHUO, PAN XIANGHUA, XU HONGQIANG, CHANG NAICHAO, WANG YAFEI
• Format: Patent
• Language: Chinese; English
• Published: 07.09.2018
• Subjects: CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTINGELECTRIC POWER; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER; ELECTRICITY; GENERATION; SYSTEMS FOR STORING ELECTRIC ENERGY

The invention relates to a cluster measuring and controlling device for spacer layer equipment of an intelligent substation. The cluster measuring and controlling device comprises two sets of measuring and controlling sub-equipment having identical configuration of media boards and being standby equipment for each other, wherein the board configuration of each set of measuring and controlling sub-equipment comprises a power supply board, a process layer interface board with an SV/GOOSE receiving interface and a GOOSE transmitting interface, an input board and a main processing board; and the power supply board, the process layer interface board and the input board of each set of measuring and controlling sub-equipment are electrically connected with the main processing board respectively.After replacement of an existing measuring and controlling device with the cluster measuring and controlling device, the number of measuring and controlling devices in an interval layer is greatly reduced; the installation, d