Substrate mother board and detection method thereof

• Main Authors: LIU CHAOQIANG, HAN JINGUI, WEN WUPENG, REN MAO, LI GUIXUAN
• Format: Patent
• Language: Chinese; English
• Published: 03.08.2018
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The application provides a substrate mother board and a detection method thereof, and relates to the technical field of display. The substrate mother board aims at solving the problem of lower defectdetection accuracy in the pattern defect detecting process. The detection method comprises the following steps: dividing the substrate mother board into multiple detection zones; carrying out defect detection on patterns of a to-be-detected panel in each detection zone, wherein the defect detecting step comprises the following specific steps: taking a picture of the substrate mother board at the corresponding position of one detection zone, and acquiring a detection image in the detection zone of each to-be-detected panel and an actual position of a register guide arranged around each to-be-detected panel in the detection zone; acquiring the positions of various pixels of each detected image in the detection zone according to the actual position of each register guide; comparing the detection images of different t