Low temperature environment test chamber and low temperature environment test method

• Main Authors: GAO YANFENG, LIU XUE, GUO CHUNLI, ZHAO RUIBING, CHEN WANHUA, SHEN YIPING, XIE GAOFENG, XU SHANTIAN, SONG YUANJIA, TANG QIANG
• Format: Patent
• Language: Chinese; English
• Published: 20.07.2018
• Subjects: CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE; PERFORMING OPERATIONS; PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL; TRANSPORTING

The invention discloses a low temperature environment test chamber and a low temperature environment test method. The low temperature environment test chamber includes a test chamber shell, a test piece mounting platform, a heat exchanger, a heating device, a temperature measuring device, a fan and an inner air duct cylinder. A test piece is arranged on the test piece mounting platform, the heat exchanger and the heating device are used to increase and decrease the temperature in the test chamber, the temperature measuring device measures the temperature in the test chamber, and the fan and the inner air duct cylinder make a circulation air duct formed in the test chamber. The method controls the temperature in the test chamber according to the temperature measured by the temperature measuring device, a target temperature and a temperature increasing and decreasing rate. A circulating air system is formed in the test chamber, so the uniformity of the temperature in the chamber is ensured, the test piece rapid