Fault detection method and device
The embodiment of the invention discloses a fault detection method and device. The KPI (Key Performance Indicator) fault detection accuracy can be improved. The method provided by the embodiment of the invention comprises the steps of obtaining a key performance indicator (KPI) parameter of to-be-de...
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Main Authors | , , , |
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Format | Patent |
Language | Chinese English |
Published |
06.07.2018
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Subjects | |
Online Access | Get full text |
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Summary: | The embodiment of the invention discloses a fault detection method and device. The KPI (Key Performance Indicator) fault detection accuracy can be improved. The method provided by the embodiment of the invention comprises the steps of obtaining a key performance indicator (KPI) parameter of to-be-detected telephone traffic statistic data; determining an abnormal probability of the KPI parameter ofthe to-be-detected telephone traffic statistic data through utilization of a LoOP (Local Outlier Probabilities) algorithm; and determining that the KPI parameter of the to-be-detected telephone traffic statistic data is in a fault state when the abnormal probability is greater than a preset threshold value.
本发明实施例公开了种故障检测方法及装置,能够提高KPI故障检测的精确性。本发明实施例方法包括:获取待检测话统数据的关键性能指标KPI参数;利用局部异常概率LoOP算法确定所述待检测话统数据的KPI参数的异常概率;当所述异常概率大于预设门限值时,确定所述待检测话统数据的KPI参数处于故障状态。 |
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Bibliography: | Application Number: CN201611240574 |