Method for improving detection sensitivity of atomic magnetometer

• Main Authors: JIN SHILONG, JIN DAISHENG
• Format: Patent
• Language: Chinese; English
• Published: 29.06.2018
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention discloses a method for improving detection sensitivity of an atomic magnetometer. The method comprises the steps as follows: (1) two convex reflectors with coincident symmetry axes are placed on two sides of an atomic air chamber; (2) probe light radiates the atomic air chamber at the incidence angle alpha and is reflected multiple times between the two convex reflectors, and the minimum of the incidence angle alpha is sin<-1>[w/(2D)], wherein w refers to the width of the probe light, and D refers to the parallel space between the two convex reflectors and the width direction ofthe atomic air chamber during first incidence of the probe light; (3) the probe light irradiates out of the atomic air chamber, and the magnetic field intensity value is measured with a method that the magnetic field intensity is in direct proportion to the total length of the probe light in the atomic air chamber during action. The passing times of the probe light in the atomic air chamber are increased under the compres