METHOD FOR LIMITING THE CURRENT IN DEVICES OF "H-BRIDGE" TYPE
The subject of the present invention is a method for limiting the current in a device of "H-bridge" type comprising a plurality of transistors (T1, T2, T3, T4), characterized in that it comprises thefollowing steps: detection of a failure in a transistor (T) from among said plurality of tr...
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Main Author | |
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Format | Patent |
Language | Chinese English |
Published |
08.06.2018
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Subjects | |
Online Access | Get full text |
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Summary: | The subject of the present invention is a method for limiting the current in a device of "H-bridge" type comprising a plurality of transistors (T1, T2, T3, T4), characterized in that it comprises thefollowing steps: detection of a failure in a transistor (T) from among said plurality of transistors; disabling of said transistor in which a failure has been detected; detection in the transistors opposite to said transistor, of the discharging of the energy accumulated at output; and disabling of the other transistors of said plurality of transistors. The present invention also relates to a system for limiting the current in a device of "H-bridge" type comprising a plurality of transistors.
本发明是针对种用于在包括多个晶体管(T1、T2、T3、T4)的"H桥"型装置中限制电流的方法,其特征在于其包括以下步骤:* 检测所述多个晶体管(T1、T2、T3、T4)中的晶体管(T)上的故障;* 关断在其上检测到故障的所述晶体管(T);* 在与所述晶体管(T)相对的晶体管上检测输出端上积累的能量的放电;以及* 关断所述多个晶体管(T1、T2、T3、T4)中的其它晶体管。本发明还涉及种用于在包括多个晶体管的"H桥"型装置中限制电流的系统。 |
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Bibliography: | Application Number: CN201680058278 |