Fault diagnosis method, system and device, and storage medium

• Main Authors: WANG BANGJUN, LING XINGHONG, ZHANG ZHAO, XUE YANGTAO, ZHANG LI, LI FANCHANG
• Format: Patent
• Language: Chinese; English
• Published: 18.05.2018
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; HANDLING RECORD CARRIERS; PHYSICS; PRESENTATION OF DATA; RECOGNITION OF DATA; RECORD CARRIERS

The invention discloses a fault diagnosis method, system and device, and a storage medium. The method comprises the steps of obtaining feature data sets corresponding to initial feature sets during normal running and fault running of a target device, thereby obtaining training data comprising the normal feature data set and the fault feature data set; calculating a corresponding KL distance between each piece of feature data in the normal feature data set and corresponding feature data in the fault feature data set, thereby obtaining a KL distance set; performing cross validation on the training data by adopting support vector machine classification; according to a validation result and the values of the KL distances in the KL distance set, determining features related to fault running inthe initial feature sets, and obtaining optimal feature sets; and when to-be-diagnosed data of the target device is obtained, determining the feature data corresponding to the optimal feature sets inthe to-be-diagnosed data,