Optical micrometer principle-based high-precision measuring scale

• Main Authors: LI XI, LIAO MENGGUANG, LI CHAOKUI, YI SIHAI
• Format: Patent
• Language: Chinese; English
• Published: 11.05.2018
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

The invention discloses an optical micrometer principle-based high-precision measuring scale. The high-precision measuring scale is provided to accurately measure the internal and external diameters of tunnels, bridges, houses, vehicles, large instruments and the like. The optical micrometer princip...