Optical micrometer principle-based high-precision measuring scale

• Main Authors: LI XI, LIAO MENGGUANG, LI CHAOKUI, YI SIHAI
• Format: Patent
• Language: Chinese; English
• Published: 11.05.2018
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

The invention discloses an optical micrometer principle-based high-precision measuring scale. The high-precision measuring scale is provided to accurately measure the internal and external diameters of tunnels, bridges, houses, vehicles, large instruments and the like. The optical micrometer principle-based high-precision measuring scale comprises a plurality of short rulers and an optical micrometer. The short rulers are coaxially connected in series to form a telescopic body according to the cross-section sizes of the short rulers. The optical micrometer is installed on one short ruler witha larger cross section at the joint of two short rulers and is aligned with scales on the other short ruler with a smaller cross section. The two ends of the measuring scale are respectively providedwith an inner measuring end of a certain length in a direction parallel to the axis, and an outer measuring end of a certain length in a direction vertical to the axis. The measuring scale is stretched out, so that the inner m