Temperature detection circuit and temperature detection method

The invention discloses a temperature detection circuit and a temperature detection method, and the circuit comprises a voltage generation circuit, an ADC positive and negative reference voltage circuit, an ADC circuit, and a decoder. The voltage generation circuit is used for generating a preset ba...

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Bibliographic Details
Main Authors REN JUN, OUYANG TUORI
Format Patent
LanguageChinese
English
Published 01.05.2018
Subjects
MEASURING
MEASURING QUANTITY OF HEAT
MEASURING TEMPERATURE
PHYSICS
TESTING
THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
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Summary:The invention discloses a temperature detection circuit and a temperature detection method, and the circuit comprises a voltage generation circuit, an ADC positive and negative reference voltage circuit, an ADC circuit, and a decoder. The voltage generation circuit is used for generating a preset band gap reference voltage and a to-be-detected voltage. The ADC positive and negative reference voltage circuit is used for converting the band gap reference voltage into the positive and negative reference voltages of an ADC. The ADC circuit is used for carrying out the analog-digital conversion ofthe to-be-detected voltage generated in the voltage generation circuit, and then generating a digital signal. The decoder is used for decoding the digital signal generated by the ADC circuit, and displaying the temperature information of a current to-be-detected chip. The objective of the invention lies in obtaining a temperature analog signal through adding one branch circuit to a band gap reference circuit, achieving th
Bibliography:Application Number: CN201711266449