Intelligent test device for radio frequency integrated circuit and test method thereof

• Main Authors: LIU YAOJUN, ZANG HONG, WU RICHENG, SU CHANG, HU MINGKUN, PENG XUEJUAN, ZHOU YUANYUAN
• Format: Patent
• Language: Chinese; English
• Published: 06.03.2018
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention relates to an intelligent test device for a radio frequency integrated circuit and a test method thereof. The intelligent test device comprises an RF signal test load mother board, an RFIC test daughter board and an ATE test platform. The RFIC test daughter board is connected to the RF signal test load mother board through a DB96 interface. The RF signal test load mother board is connected to the ATE test platform through a euro connector. The ATE test platform is combined with application software to complete the development of an RFIC chip program and the automatic execution ofa test program. According to the invention, the high-speed RF signal test load mother board and the RFIC test daughter board are adopted, the test cost is reduced, the RFIC test equipment is carried,the RFIC chip test program is developed through the software platform, and the intelligentization and generalization of the RFIC test are achieved. 本发明涉及种射频集成电路的智能化测试设备及其测试方法，包括RF信号测试负载母板、RFIC测试子板和ATE测试平台，所述RFIC测试子板通过DB96接口连接