Inspection apparatus

• Main Authors: SUGIMOTO KAZUYUKI, MAKI HIROMI
• Format: Patent
• Language: Chinese; English
• Published: 28.11.2017
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

Provided is an X-ray inspection apparatus (10) provided with: an X-ray source (13) that applies X rays to a product that includes a plurality of types of items that are disposed at different positions; an X-ray detection unit (14) that detects transmitted X rays that pass through the product; an image generation unit (31) that generates an X-ray transmission image on the basis of the transmitted X rays; an inspection unit (35) that inspects the product for a defect on the basis of the X-ray transmission image; and a storage unit (34) that stores a plurality of item regions, each of which is set for an item among the plurality of types of items in association with the position of the item in the product, and binary thresholds, each of which is set for an item region among the plurality of item regions. The inspection unit (35) identifies the item regions on the basis of the X-ray transmission image, inspects each of the item regions on the basis of the corresponding binary threshold set for the item region, an