Plate defect identification method and device

The embodiments of the invention provide a plate defect identification method and device. In one embodiment, the plate defect identification method includes the following steps: acquiring multiple groups of feature images corresponding to multiple features of a plate; extracting features from the fe...

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Bibliographic Details
Main Authors LI ZHIHAO, ZHUANG QIAN, LIU JIAMEI, XU KAIHONG, GUO XIANGJUAN, SHI HENGXIU
Format Patent
LanguageChinese
English
Published 28.11.2017
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Summary:The embodiments of the invention provide a plate defect identification method and device. In one embodiment, the plate defect identification method includes the following steps: acquiring multiple groups of feature images corresponding to multiple features of a plate; extracting features from the feature images; analyzing the features to get specified feature parameter groups; training a set composed of the specified feature parameter groups corresponding to the feature images based on a PSO (Particle Swarm Optimization)-SVM (Support Vector Machine) algorithm to classify the feature images, and determining the defects of the plate according to the classification result. 本发明实施例提供板材缺陷识别方法及装置,在个实施例中,所述板材缺陷识别方法包括:获取板材的多个特征对应的多组特征图像;对多组所述特征图像进行特征提取;对所述特征进行分析以获得指定特征参数组;对所述多组特征图像对应的指定特征参数组形成的集合基于PSO-SVM算法进行训练以对所述多组特征图像进行分类,并根据分类结果确定板材的缺陷。
Bibliography:Application Number: CN201710669977