Data index incidence relation determination method and device

The invention relates to computer technologies, discloses a data index incidence relation determination method and device, and aims at realizing the correct optimization of data indexes. The method comprises the following steps of: carrying out layer-by-layer recall from a data node at the bottom la...

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Bibliographic Details
Main Author SONG KEFENG
Format Patent
LanguageChinese
English
Published 24.10.2017
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:The invention relates to computer technologies, discloses a data index incidence relation determination method and device, and aims at realizing the correct optimization of data indexes. The method comprises the following steps of: carrying out layer-by-layer recall from a data node at the bottom layer of an incidence relation tree of a target data index on the basis of a to-be-adjusted attribute of the target data index, so as to screen all the data nodes, the calculation processes of which refer to the to-be-adjusted attribute of the target data index, in generation scripts; and outputting the screened data nodes and corresponding generation scripts, so as to obtain all the generation scripts of the data nodes which influence the to-be-adjusted attribute of the target data index, carry out targeted optimization on the generation scripts in the subsequent operations, adjust the to-be-adjusted attribute to an ideal state and then effectively realize the correct optimization of the target data index. 本申请涉及计算机技
Bibliography:Application Number: CN20161202872