探针

• Format: Patent
• Language: Chinese
• Published: 12.03.2021
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

本发明的目的在于提供一种能够实现作为测定对象的电子部件相对于电路基板的高密度化的探针。探针(1)是能够同时测定多个部位的探针。另外，探针(1)具备：多个主体部(30)，其包括与连接器(300)接触的中心导体(20)；以及第一部件(50)，其将多个主体部(30)捆扎在一起。在第一部件(50)设置有供多个中心导体(20)的末端从底面突出的凹部(C1)。凹部(C1)具有从其底部朝向开口部扩展的倾斜面(S1)。 A probe that enables a circuit board for electronic components, which is a measurement subject, to be disposed more densely. The probe is capable of simultaneously measuring a plurality of locations. The probe includes a plurality of main body portions having central conductors that make contact with connectors, and a first member that binds the plurality of main body portions together. A recess portion, having a base surface from which tip ends of the plurality of central conductors project, is provided in the first member. The recess portion has a sloped surface that flares outward from a base portion of the recess portion toward an opening in the recess portion.