Gas well integrity inspection system

A well integrity inspection system (100) configured to inspect a well structure (102) including multiple concentric layers. The well integrity inspection system (100) includes an inspection probe (104) positioned in the well structure (102). The inspection probe (104) includes a plurality of excitat...

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Bibliographic Details
Main Authors ROSS WILLIAM ROBERT, BUENO CLIFFORD, PLOTNIKOV YURI ALEXEYEVICH, PRICE JOHN SCOTT, NIETERS EDWARD JAMES, LEE SUSANNE MADELINE, BERKCAN ERTUGRUL
Format Patent
LanguageChinese
English
Published 18.08.2017
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Summary:A well integrity inspection system (100) configured to inspect a well structure (102) including multiple concentric layers. The well integrity inspection system (100) includes an inspection probe (104) positioned in the well structure (102). The inspection probe (104) includes a plurality of excitation assemblies (132, 162) for transmitting a plurality of radiation emissions (134, 164) into the well structure (102). The plurality of excitation assemblies (132, 162) includes at least a neutron excitation assembly (132) and an X-ray excitation assembly (162). The inspection probe (104) also includes a plurality of detection assemblies (136, 166) configured to receive a plurality of backscatter radiation returns (138, 168) from the well structure. The plurality of detection assemblies (136, 166) includes at least a neutron detection assembly (136) and an X-ray detection assembly (166). The well integrity inspection system (100) further including a processor (190) operatively coupled to the inspection probe (104)
Bibliography:Application Number: CN201580058721