Fault voltage generation device and voltage drop test method

The invention relates to a fault voltage generation device and a voltage drop test method. The device comprises an electric reactor, a by-pass switch and a short-circuit switch. One end of the short-circuit switch is connected with one end of the electric reactor, and the other end of the short-circ...

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Bibliographic Details
Main Authors YAO CHENGYONG, ZHANG JINGUO, YAO HAIQIANG, ZHANG JINBIN
Format Patent
LanguageChinese
English
Published 18.08.2017
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Summary:The invention relates to a fault voltage generation device and a voltage drop test method. The device comprises an electric reactor, a by-pass switch and a short-circuit switch. One end of the short-circuit switch is connected with one end of the electric reactor, and the other end of the short-circuit switch is grounded; one end of the by-pass switch is connected with the other end of the electric reactor, and the other end of the electric reactor is served as a power grid access point; the other end of the by-pass switch is connected with a middle contact on the electric reactor; and the middle contact is located between the two ends of the electric reactor and is served as a dropped voltage test point. Only one electric reactor is arranged, the structure is simple, the number of electric reactor monomers is reduced, and the equipment cost is lowered to a great extent. Meanwhile, wiring is simple, only the position of the middle contact needs to be moved, compared with the prior art, operation in the test p
Bibliography:Application Number: CN201710221535