Fault voltage generation device and voltage drop test method
The invention relates to a fault voltage generation device and a voltage drop test method. The device comprises an electric reactor, a by-pass switch and a short-circuit switch. One end of the short-circuit switch is connected with one end of the electric reactor, and the other end of the short-circ...
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Main Authors | , , , |
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Format | Patent |
Language | Chinese English |
Published |
18.08.2017
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Subjects | |
Online Access | Get full text |
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Summary: | The invention relates to a fault voltage generation device and a voltage drop test method. The device comprises an electric reactor, a by-pass switch and a short-circuit switch. One end of the short-circuit switch is connected with one end of the electric reactor, and the other end of the short-circuit switch is grounded; one end of the by-pass switch is connected with the other end of the electric reactor, and the other end of the electric reactor is served as a power grid access point; the other end of the by-pass switch is connected with a middle contact on the electric reactor; and the middle contact is located between the two ends of the electric reactor and is served as a dropped voltage test point. Only one electric reactor is arranged, the structure is simple, the number of electric reactor monomers is reduced, and the equipment cost is lowered to a great extent. Meanwhile, wiring is simple, only the position of the middle contact needs to be moved, compared with the prior art, operation in the test p |
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Bibliography: | Application Number: CN201710221535 |