Optical detecting system and optical detecting method using same

The invention discloses an optical detecting system which comprises a platform, a first three-dimensional scanning device, a second three-dimensional scanning device, a first two-dimensional image pickup device, a second two-dimensional image pickup device, a direction turning device and a transport...

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Bibliographic Details
Main Authors JIAN HONGDA, LIN SIYAN, ZHANG WEIZHE, PAN SHIYAO
Format Patent
LanguageChinese
English
Published 08.08.2017
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Summary:The invention discloses an optical detecting system which comprises a platform, a first three-dimensional scanning device, a second three-dimensional scanning device, a first two-dimensional image pickup device, a second two-dimensional image pickup device, a direction turning device and a transporting device. The platform is provided with a first detecting area, a second detecting area, a material inlet area, a direction turning area and a material outlet area. The first three-dimensional scanning device and the first two-dimensional image pickup device are arranged in the first detecting area. The second three-dimensional scanning device and the second two-dimensional image pickup device are arranged in the second detecting area. The first three-dimensional scanning device and the second three-dimensional scanning device measure the three-dimensional topography of a to-be-detected object. The first two-dimensional image pickup device and the second two-dimensional image pickup device measure the two-dimensi
Bibliography:Application Number: CN2016165887