Bench-type near-infrared probe device

• Main Authors: ZHANG KUAN, FANG LINGFENG, SHEN YI, XUE WENYUN
• Format: Patent
• Language: Chinese; English
• Published: 04.08.2017
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention discloses a bench-type near-infrared probe device, comprising a mounting platform and a probe body releasably mounted on the mounting platform; the probe body comprises a lighting fixing upper seat, a light source mounted on the lighting fixing upper seat through a fixing component, and a light source protective component fixedly mounted in the light emerging direction of the light source; the mounting platform comprises a lighting fixing lower seat; the power end of the light source is connected to an external power supply. The bench-type near-infrared probe device allows a light source to be detached and changed conveniently during test, adjustment and maintenance of an infrared analyzer, testing efficiency is improved greatly, and time cost is lowered. 本发明公开种台式近红外探头装置，包括安装平台，以及可拆卸安装在安装平台上的探头本体，所述探头本体包括采光固定上座，通过固定组件安装在采光固定上座上的光源，以及固定安装在光源光线发射方向上的光源保护组件；所述安装平台包括采光固定下座；所述光源的电源端与外界电源相连。上述台式近红外探头装置可实现近红外分析仪在测试、调整、维护时对光源进行便捷式拆卸、更换，大幅度提高测试工作效率，降低时间成本。