Method and circuit apparatus for detecting a failure of at least one light emitting diode in a light emitting diode arrangement
A method for detecting a failure of at least one light emitting diode in a light emitting diode arrangement to which a supply current is applied by a constant-current source via a supply terminal and in which a respective luminous state of the light emitting diodes is set individually or in groups b...
Saved in:
Main Author | |
---|---|
Format | Patent |
Language | Chinese English |
Published |
18.07.2017
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | A method for detecting a failure of at least one light emitting diode in a light emitting diode arrangement to which a supply current is applied by a constant-current source via a supply terminal and in which a respective luminous state of the light emitting diodes is set individually or in groups by means of a respective switching element by respective short-circuiting is disclosed, wherein a voltage signal of a chain voltage dropped across the light emitting diodes and dependent on the respective switching state of the switching elements is tapped off by a circuit apparatus at the supply terminal. The voltage signal is fed to an analog maximum value detector of the circuit apparatus, the maximum value detector is operated for a predetermined measurement duration and a maximum value signal of the voltage signal is provided at an output of the maximum value detector after the measurement duration.
本发明涉及种用于探测在发光二极管设备(2)中的至少个发光二极管(3)的失灵的方法,利用恒流源(6)经由供电接头(7)给所述发光二极管设备施加供电电流(I),并针对该发光二极管设备,借助相应的开关部件(4)通过相应的短路(31) |
---|---|
Bibliography: | Application Number: CN201610898669 |