Optical leaked current testing device based on garnet

• Main Authors: SHEN YANGFAN, ZHAO XINWEI, PAN QIAN, HAO RUIRUI, JIAO XINBING, BAI XUE
• Format: Patent
• Language: Chinese; English
• Published: 20.06.2017
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention relates to an optical leaked current testing device based on garnet. A detection unit consists of a garnet module, graphite and a tested module, wherein the garnet module, the graphite and the tested module are sequentially attached from the front to the back. The laser light emitted by a laser is focused by a lens, and then enters a beam splitting prism to be divided into two beams, wherein the reflection light is collected by a first light intensity detector, and the transmission light enters the detection unit to reach the garnet module and then reaches the graphite through the garnet module, and finally is reflected by the graphite to enter the garnet module to form reflection light for output. The output light enters a polarization beam splitting prism to be divided, wherein the reflection light is detected by a second light intensity detector, and the transmission light is detected by a third light intensity detector. Compared with the distribution of the intensity of incident light, the d