ELECTRONIC DEVICE HAVING FAULT MONITORING FOR A MEMORY AND ASSOCIATED METHODS

• Main Authors: FABIO ENRICO CARLO DISEGNI, OM RANJAN
• Format: Patent
• Language: Chinese; English
• Published: 06.06.2017
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; INFORMATION STORAGE; INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER; PHYSICS; STATIC STORES

An electronic device includes a memory having memory locations being subject to transient faults and permanent faults, and a fault detection circuit coupled to the memory. The fault detection circuit is configured to read the memory locations at a first time, and determine a first fault count and fault map signature including the transient and permanent faults at the first time based upon reading the plurality of memory locations, and to store the first fault count and fault map signature. The fault detection circuit is configured to read the memory locations at a second time and determine a second fault count and fault map signature including the transient and permanent faults at the second time based upon reading the memory locations, and compare the stored first fault count and fault map signature with the second fault count and fault map signature to determine a permanent fault count. 本公开提供了具有用于存储器的故障监测的电子设备及相关联的方法。种电子设备，该电子设备包括具有经受瞬态故障和永久故障的多个存储器位置的存储器以及耦接于该存储器的故障检测电路。该故障检测电路被配置成用于：在第时间读取这些存储器位置，并且在该第时间基