Piezoelectric stack direct driving type macro-micro combined biaxial stretching-fatigue testing system

• Main Authors: ZHANG FU, QIAO YUANSEN, HONG KUN, YANG LIGUO, WANG ZHIWEI, YU MIAO, LIU HANG, REN ZHUANG, ZHOU MINGXING, XIAO HUIQIONG, WANG SHUNBO, FAN ZUNQIANG, LIU QIUCHENG, XUE BORAN
• Format: Patent
• Language: Chinese; English
• Published: 17.05.2017
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention relates to a piezoelectric stack direct driving type macro-micro combined biaxial stretching-fatigue testing system, and belongs to the field of precision scientific instruments. The piezoelectric stack direct driving type macro-micro combined biaxial stretching-fatigue testing system is mainly composed of a precision driving-transmission unit, a CCD (Charge Coupled Device) imaging detection unit, a mechanical and deformation signal detection unit, a test piece clamping unit and a piezoelectric stack driver unit. In a testing process, the CCD imaging detection unit is used for carrying out in-situ observation on a central point of a test piece; once the central point is deviated, real-time deviation compensation can be carried out through the large-rigidity and high-frequency response piezoelectric stack driver unit, and a position of the central point of the test piece in the testing process is relatively fixed. The testing system has a wide application range, and can be used for realizing sing