Batch testing method and batch testing system for chips

• Main Authors: ZHANG BO, LOU FANGCHAO, JIANG XINGYUAN, SHEN JIAHAO, WU ZHONGJIE
• Format: Patent
• Language: Chinese; English
• Published: 10.05.2017
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention discloses a batch testing method and a batch testing system for chips. The method comprises the steps of S300, transmitting testing instruction information to a first bus port of a to-be-tested chip through a data signal bus; S400, receiving the testing instruction information which is transmitted from a master control chip by the to-be-tested chip through the first bus port; S500, transmitting a response instruction to the master control chip by the to-be-tested chip according to first preset address information; S600, determining the operation state of the to-be-tested chip by the master control chip according to the response instruction of the first preset address information, and when the operation state is abnormal, executing a step S700; and S700, replacing the abnormal to-be-tested chip by means of the to-be-tested chip in the first preset address information. The batch testing method and the batch testing system realize simultaneous testing on a large batch of chips and furthermore can m