Single-crystal diamond and method for manufacturing same, tool including single-crystal diamond, and component including single-crystal diamond

In a single-crystal diamond (20), groups of crystal defect points (20dp), which are points where distal ends of crystal defect lines (20dq) indicating lines where crystal defects (20d) are present reach a principal crystal growth face (20m), exist as aggregates in an X-ray topogram for the primary c...

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Bibliographic Details
Main Authors NISHIBAYASHI YOSHIKI, SUMIYA HITOSHI, TATSUMI NATSUO
Format Patent
LanguageChinese
English
Published 19.04.2017
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Summary:In a single-crystal diamond (20), groups of crystal defect points (20dp), which are points where distal ends of crystal defect lines (20dq) indicating lines where crystal defects (20d) are present reach a principal crystal growth face (20m), exist as aggregates in an X-ray topogram for the primary crystal growth face (20m). Furthermore, a plurality of crystal defect linear aggregation regions (20r) in which a group of crystal defect points (20dp) aggregates and extends linearly in a direction 30 DEG or less from an arbitrarily specified direction are arranged in rows in the single-crystal diamond (20). A single-crystal diamond is thereby provided that is suitable for use in a cutting tool, a polishing tool, an optical component, an electronic component, a semiconductor material, or the like. 在单晶金刚石(20)的晶体生长主表面(20m)的X射线形貌照片中,晶体缺陷点(20dp)的组聚集而存在,各个晶体缺陷点(20dp)是到达所述晶体生长主表面(20m)的晶体缺陷线(20dq)的前端点,所述晶体缺陷线(20dq)表示其中存在晶体缺陷(20d)的线。此外,在所述单晶金刚石(20)中,平行存在多个晶体缺陷线状聚集区域(20r)。在所述多个晶体缺陷线状聚集区域(20r)中,晶体缺陷点(20dp)的组聚集并在相对于个任意规定方向成30
Bibliography:Application Number: CN201580039728