Method for detecting silicon doping of oxidized scale

• Main Authors: DONG QINGMU, YE SHU'AI, PU XULI
• Format: Patent
• Language: Chinese; English
• Published: 05.04.2017
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention relates to a method for detecting silicon doping of oxidized scale. The method comprises steps of qualitative detection of foreign sand content and quantitative detection of mixing of foreign smelting slag. By the method, silicon doping of oxidized scale can be detected, and whether sand and smelting slag are doped can be judged. The method provides guidance for identifying relevant risks for enterprises before shipment and reducing economic losses, and is also helpful for carrying out scientific supervision on oxidized scale quality for supervision departments, enhancing utilization rate of resources and alleviating the present situation of mineral resource shortage in our country. 本发明涉及种氧化铁皮中硅掺杂情况的检测方法，包括定性检测外来沙土含有情况和定量检测外来冶炼渣的混入情况。本发明可检测出氧化铁皮中硅元素的夹杂情况，判断是否夹杂了沙土、冶炼渣，为企业在装运前识别相关风险，减少经济损失提供指导，同时也有助于监管部门进行氧化铁皮质量的科学监管，提高资源的利用率，缓解我国矿产资源紧缺的现状。