Measuring device and measuring assembly

• Main Authors: BJOERN SCHAEFER, MICHAEL GERDING
• Format: Patent
• Language: Chinese; English
• Published: 29.03.2017
• Subjects: ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS; MEASURING; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR; MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL; METERING BY VOLUME; PHYSICS; TARIFF METERING APPARATUS; TESTING

A measuring arrangement and a measuring device having a sensor device, a processing device, a storage device, an interface and a control device that allows for a simplified testing of the functionality of the measuring device is achieved in that the control device retrieves externally provided data via the interface and performs a test of the measuring device. The test thereby involves the control device determining a reference value from the externally provided data, comparing the reference value to a measured value generated by the processing device and generating a comparison result based thereupon. Alternatively, the test involves the control device using the externally provided data for the generation of new calculation data to be stored in the storage device and storing the new calculation data in the storage device. 本发明涉及测量仪器和测量设备，具体而言，描述和示出了具有传感器装置、处理装置、储存装置、接口和控制装置的测量仪器。本发明的任务在于，提出种测量仪器，其允许简化地检查测量仪器的功能性。所述任务如下来解决，即控制装置通过接口访问在外部提供的数据并且实行检查测量仪器。在此检查或者在于，控制装置从在外部提供的数据中求得参考值，将参考值与由处理装置产生的测量值进行比较并且以此为出发点来