Device and method for measuring workpieces

The invention relates to a device and a method for measuring, in a tactile-optical manner, geometrical features or structures on a workpiece. In order to be able to easily and accurately orient a probe extension so as to perform precise measurements, according to the invention, a probe comprises a p...

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Bibliographic Details
Main Authors ZOELLER SEBASTIAN, HECHLER MARKUS, GRUENWALD STEFAN, HOPP BENJAMIN, ANDRAES MATTHIAS, SCHMIDT INGOMAR, LINZ-DITTRICH SABINE, CHRISTOPH RALF, ETTEMEYER ANDREAS
Format Patent
LanguageChinese
English
Published 12.10.2016
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Summary:The invention relates to a device and a method for measuring, in a tactile-optical manner, geometrical features or structures on a workpiece. In order to be able to easily and accurately orient a probe extension so as to perform precise measurements, according to the invention, a probe comprises a probe extension (13) which is flexible in at least some sections and which includes a fastening section to be introduced into a receptacle (14) that has a fastening section (60) designed as an anti-rotating element. 本发明涉及种用于接触光学测量在工件处的几何的特征或者说结构的装置和方法。为了能够没有问题地执行用于实施精确的测量的探测器延长件的准确的取向，提出种探测器，包括实施为至少按区段地弯曲弹性的探测器延长件(13)连同用于引入容纳部(14)中的固定区段，其具有构造为抗扭件的固定区段(60)。
Bibliography:Application Number: CN201480075101