System, device and method for identifying significant and consumable-insensitive trace features
A method, a device and a computer system for identifying significant and consumable-insensitive trace features are provided. A computer computes a residual in a first regression of one or more secondary factors on a target. The computer computes residuals in a second regression of the one or more se...
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Main Authors | , , |
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Format | Patent |
Language | Chinese English |
Published |
05.10.2016
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Subjects | |
Online Access | Get full text |
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Summary: | A method, a device and a computer system for identifying significant and consumable-insensitive trace features are provided. A computer computes a residual in a first regression of one or more secondary factors on a target. The computer computes residuals in a second regression of the one or more secondary factors on each of one or more trace features in one or more trace feature sets. The computer computes, for the one or more trace feature sets, coefficients of determination in a third regression of the residuals in the second regression on the residual in the first regression. The computer ranks the one or more trace feature sets by sorting the coefficient of determination. The computer determines, based on rankings of the one or more trace feature sets, significant trace feature sets.
提供了种用于识别重要的且次要因素不敏感的痕迹特征的方法、设备和计算机系统。计算机计算个或多个次要因素对目标的第回归中的残差。所述计算机计算所述个或多个次要因素对个或多个痕迹特征集中的个或多个痕迹特征的每个的第二回归中的残差。所述计算机对于所述个或多个痕迹特征集,计算所述第二回归中的残差对所述第回归中的残差的第三回归中的确定系数。所述计算机通过对所述确定系数排序,对所述个或多个痕迹特征集排名。所述计算机基于对所述个或多个痕迹特征集的排名,确定重要 |
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Bibliography: | Application Number: CN201610157620 |