Anodized film layer coating thickness detecting method

• Main Authors: WEN YINGHUI, WANG CHAOLIN
• Format: Patent
• Language: Chinese; English
• Published: 20.04.2016
• Subjects: APPARATUS THEREFOR; CHEMISTRY; ELECTROFORMING; ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; METALLURGY; PHYSICS; PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTIONOF COATINGS; TESTING

The invention discloses an anodized film layer coating thickness detecting method. Anodized film layer coating steps include pretreating, anodizing, deionized water flushing, drying and checking, wherein in the anodizing process, an anodizing brush plating pen is used, an anodizing solution is adopted for anodizing, a to-be-treated region of a part is wetted by using electrolyte before treatment, then, and is powered on, the part is used as an anode, the anodizing brush plating pen is used as a cathode, the current is 15-20A/dm , and the relative motion speed between the part and the anodizing brush plating pen is 10m/min; in order to control the thickness of the anodized film layer coating thickness, the voltage change between the part and the anodizing brush plating pen is observed while anodizing, and the motion of the anodizing brush plating pen in the to-be-treated region of the part is stopped after the voltage is increased to a preset numerical value; and the preset numerical value of the voltage is ob