Method for processing a carrier, a method for operating a plasma processing chamber, and a method for processing a semiconductor wafer

Various embodiments of the disclosure relate to a method for processing a carrier, a method for operating a plasma processing chamber, and a method for processing a semiconductor wafer. According to various embodiments, a method for processing a carrier may include: performing a dry etch process in...

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Bibliographic Details
Main Authors BRENCHER LOTHAR, RENNER MICHAEL
Format Patent
LanguageChinese
English
Published 06.04.2016
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Summary:Various embodiments of the disclosure relate to a method for processing a carrier, a method for operating a plasma processing chamber, and a method for processing a semiconductor wafer. According to various embodiments, a method for processing a carrier may include: performing a dry etch process in a processing chamber to remove a first material from the carrier by an etchant, the processing chamber including an exposed inner surface including aluminum and the etchant including a halogen; and, subsequently, performing a hydrogen plasma process in the processing chamber to remove a second material from at least one of the carrier or the inner surface of the processing chamber.
Bibliography:Application Number: CN201510634108