Semiconductor substrate and manufacturing method thereof
The invention relates to a semiconductor substrate, which comprises an organic material layer, a first redistribution layer, a second redistribution layer, a plurality of first engagement features and a plurality of second engagement features, wherein the organic material layer comprises two surface...
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Format | Patent |
Language | English |
Published |
10.02.2016
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Subjects | |
Online Access | Get full text |
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Abstract | The invention relates to a semiconductor substrate, which comprises an organic material layer, a first redistribution layer, a second redistribution layer, a plurality of first engagement features and a plurality of second engagement features, wherein the organic material layer comprises two surfaces and covers a plurality of metal columns; the first redistribution layer is located at one surface of the organic material layer and is electrically connected to the metal columns; the second redistribution layer is located at the other surface of the organic material layer and is electrically connected to the metal columns; the plurality of first engagement features are mutually spaced by a first distance; the plurality of second engagement features are mutually spaced by a second distance, and the first distance is greater than the second distance. |
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AbstractList | The invention relates to a semiconductor substrate, which comprises an organic material layer, a first redistribution layer, a second redistribution layer, a plurality of first engagement features and a plurality of second engagement features, wherein the organic material layer comprises two surfaces and covers a plurality of metal columns; the first redistribution layer is located at one surface of the organic material layer and is electrically connected to the metal columns; the second redistribution layer is located at the other surface of the organic material layer and is electrically connected to the metal columns; the plurality of first engagement features are mutually spaced by a first distance; the plurality of second engagement features are mutually spaced by a second distance, and the first distance is greater than the second distance. |
Author | HSIAO, WEI-MIN |
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Notes | Application Number: CN20141341520 |
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PublicationDateYYYYMMDD | 2016-02-10 |
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PublicationYear | 2016 |
RelatedCompanies | ADVANCED SEMICONDUCTOR ENGINEERING, INC |
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Snippet | The invention relates to a semiconductor substrate, which comprises an organic material layer, a first redistribution layer, a second redistribution layer, a... |
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SubjectTerms | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
Title | Semiconductor substrate and manufacturing method thereof |
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