Embedded yarn evenness testing device and working method thereof

• Main Authors: LIAO DASHENG, FENG FEI, WANG WEISHAN, QIAO XIAOHUA
• Format: Patent
• Language: English
• Published: 06.01.2016
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention provides an embedded yarn evenness testing device. The embedded yarn evenness testing device comprises a sensor circuit, a signal processing circuit, a two-phase four-wire stepping motor and a sample drawing device. The embedded yarn evenness testing device is structurally characterized by further comprising a first auxiliary single-chip microcomputer, a second auxiliary single-chip microcomputer, a main control single-chip microcomputer, an EEPROM module, a rotating code switch, a storing SRAM, the sensor circuit, the signal processing circuit, a stepping motor driving chip, a CPLD module, a cache SRAM, a video memory SRAM and an LCD. A working method of the device includes the steps of parameter selecting, detecting starting, real-time detecting, detecting signal processing, detecting signal real-time calculating processing, real-time drawing of a detected yarn unevenness graph, testing result calculating and displaying and the like. According to the embedded yarn evenness testing device and the working method, the three embedded single-chip microcomputers in a main-auxiliary mode are adopted to replace a computer or an industrial personal computer in a traditional testing device, a computer input device is replaced by the rotating code switch, and therefore the hardware cost and the breakdown rate of the yarn testing device are greatly reduced.