Software defect prediction method and system

• Main Authors: GAO YAN, XIONG JING, LIN JUN, YANG CHUNHUI, LI DONG
• Format: Patent
• Language: English
• Published: 09.09.2015
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

The invention relates to a software defect prediction method and system, and the method comprises the steps: obtaining sample software modules and clustering to obtain clustered subsets; calculating a Gauss parameter of the clustered subsets, generating a pseudo-defect sample according to the Gauss parameter, and obtaining an updated defect sample set according to the software defect sample set and the pseudo-defect sample; training according to the updated defect sample set to obtain a defect prediction model, performing defect prediction on software to be detected according to the defect prediction model and outputting a prediction result. The clustered subsets are formed by clustering the sample software modules, the clustered subsets are subject to Gauss analysis calculation to obtain the Gauss parameter, and then the pseudo-defect sample is generated according to the Gauss parameter. More defect data are increased to generate the updated defect sample set for training, the accuracy of the defect prediction model is improved, the defect prediction model can better estimate and fit the defect data and the prediction accuracy for software defects is improved.