Circuit for measuring width of single-particle transient pulse

• Main Authors: LUO JIAJUN, LI XINXIN, LIU HAINAN, SU XIAOHUI, HAN ZHENGSHENG, HAO LE
• Format: Patent
• Language: English
• Published: 29.07.2015
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention discloses a circuit for measuring width of a single-particle transient pulse. The circuit includes a control signal generation circuit and at least one grade of dual-delay comparison circuit, wherein the control signal generation circuit is provided with a reset input end, a single-particle pulse receiving end, a pulse start output end and a pulse end output end; each grade of dual-delay comparison circuit is provided with a reset input end, a first delay input end, a second delay input end, a first delay output end, a second delay output end and a comparison output end. The first delay input end in the first grade is connected with the pulse start output end while the second delay input end is connected with the pulse end output end, and from the second grade, the first delay input end in each grade is connected with the first delay output end of the previous grade while the second delay input end is connected with the second delay output end of the previous grade. The measuring circuit realized according to the invention can measure the high level pulse width of single-particle transient pulse, and is wide in measurement range and high in measurement accuracy.