LED test process and correction method for same

• Main Authors: WANG SHIJIE, MAI JIAYI, LIU XIAOLAN, JU JIANJUN
• Format: Patent
• Language: English
• Published: 15.07.2015
• Subjects: ADVERTISING; ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION; BASIC ELECTRIC ELEMENTS; COLORIMETRY; CRYPTOGRAPHY; DISPLAY; EDUCATION; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT; MEASURING; PHYSICS; RADIATION PYROMETRY; SEALS; SEMICONDUCTOR DEVICES; TESTING

The invention discloses a method for generating a correction function for an LED test process. The method comprises the following steps: light emitted by a reference LED and light reflected by one or more inactive LEDs disposed on a panel are detected in the field of view of a detector; the number of the inactive LEDs in the field of view is changed so that the error value of at least one optical parameter is obtained as the function of the number of the inactive LEDs in the field of view; light emitted by the reference LED or an active LED is detected under the condition that there is no other LEDs so as to determine at least one reference value of the or each optical parameter, wherein the active LED and the reference LED have the same optical attribute; and the difference between the error value and the or each reference value is calculated to generate a correction function, wherein the correction function is dependent on the number of the inactive LEDs arranged in the field of view of the detector when the detector detects light emitted by an LED under test.