System for testing dielectric properties by using strip line testing method

• Main Authors: ZHANG YONGHUA, CHEN WENLU, LIU LIGUO, LI XIAOMING, WU NINGBIAO, SHI XIAOCHUAN, TANG YABIN, JIA YAN
• Format: Patent
• Language: English
• Published: 29.04.2015
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention provides a system for testing dielectric properties by using a strip line testing method. The system comprises laminated testing samples, a testing clamp, a pressure device, a first coupling device, a second coupling device, a first displacement table, a second displacement table, a vision amplification system, a vector network analyzer and a control processing device, wherein the testing clamp is used for clamping the laminated testing samples; the pressure device is used for applying pressure to the testing clamp so as to remove residual air in the laminated testing samples; the first coupling device is coupled with a first end of the testing clamp; the second coupling device is coupled with a second end of the testing clamp; the first displacement table is fixed with the first coupling device; the second displacement table is fixed with the second coupling device; the vision amplification system is used for assisting in coupling between the testing clamp and the first coupling device and coupling between the testing clamp and the second coupling device; the vector network analyzer is connected with the first coupling device and the second coupling device; and the control processing device is connected with the vector network analyzer.