Test head

• Main Authors: XU XIXIAO, ZHAO YONGCUN, GUO CHAO, LYU SHAOLIN, SUN WEIDONG, MA JINYONG
• Format: Patent
• Language: English
• Published: 18.02.2015
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention relates to a test head. A test head sliding rail is fixed on the inner side of a test head mounting seat, and a test head limiting block is fixed on the outer side of the test head mounting seat; a test head sliding block is mounted on the test head sliding rail in a matching way; a probe fixing seat is fixedly connected to the test head sliding block; a probe is mounted on the probe fixing seat; a test head cylinder is mounted on the test head mounting seat by virtue of a test head cylinder mounting seat; the lower end of a piston of the test head cylinder is connected with the probe fixing seat; the test head mounting seat is of an L-shaped structure; a groove hole is formed in the lower part of the L-shaped structure. The test head limiting block is provided with a square plate with a limiting flange, and the limiting flange is perpendicular to the square plate; a convex head is arranged on the probe fixing seat and is positioned above the limiting flange, and the limiting flange can be used for limiting a downward movement position of the convex head. The test head has the advantages that a cylinder moves to drive the probe fixing seat to descend, so that the probe is driven to descend and reaches a standard operation position for testing.