APPARATUS FOR TESTING MAGNETIC FIELD SENSOR ON WAFER AND METHOD THEREOF
An apparatus and a method for testing a magnetic field sensor are provided, in which the method includes arranging a coil for generating a magnetic field, applying the magnetic field to the magnetic field sensor using the coil, and detecting the magnetic field applied to the magnetic field sensor.
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
11.02.2015
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Subjects | |
Online Access | Get full text |
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Summary: | An apparatus and a method for testing a magnetic field sensor are provided, in which the method includes arranging a coil for generating a magnetic field, applying the magnetic field to the magnetic field sensor using the coil, and detecting the magnetic field applied to the magnetic field sensor. |
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Bibliography: | Application Number: CN20141181517 |