Correcting method for spectral line interference in atomic emission spectrometric analysis of spark source

• Main Authors: JIA YUNHAI, LIU JIA, YUAN LIANGJING, FENG GUANG
• Format: Patent
• Language: English
• Published: 28.01.2015
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention belongs to the field of quantitative analysis of atomic emission spectrometry and particularly relates to a correcting method for spectral line interference in the atomic emission spectrometric analysis of a spark source. In the correcting method, a to-be-tested sample comprises a to-b...