Correcting method for spectral line interference in atomic emission spectrometric analysis of spark source

• Main Authors: JIA YUNHAI, LIU JIA, YUAN LIANGJING, FENG GUANG
• Format: Patent
• Language: English
• Published: 28.01.2015
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention belongs to the field of quantitative analysis of atomic emission spectrometry and particularly relates to a correcting method for spectral line interference in the atomic emission spectrometric analysis of a spark source. In the correcting method, a to-be-tested sample comprises a to-be-tested element X, and interference elements Ai and Mj. The influence of the interference elements is eliminated by the method through the study of the interference spectral lines and the interference rules of the interference elements Ai and Mj so as to automatically correct the analyzed spectral lines. The method is used for solving the problem that mutual interference among different elements in the spectrometric analysis process causes an inaccurate quantitative analysis result and is suitable for the atomic emission spectrometric analysis of the spark or spark-like source. No devices needs to be additionally arranged, and the analysis cost and the time are not increased. The correcting method is particularly suitable for rapid and accurate analysis tasks.