Simple boundary scan test system and method based on single-chip microcomputer

• Main Authors: PAN YINGFENG, HE CHANGHUI, PENG SHIRUI, ZHU YUANQING, LENG YI, HONG JIEFENG, GENG FANGZHI
• Format: Patent
• Language: Chinese; English
• Published: 05.11.2014
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention discloses a simple boundary scan test system based on a single-chip microcomputer. The simple boundary scan test system comprises a control platform, a USB-to-serial port conversion circuit and a JTAG control circuit, wherein the control platform is used for transmitting TMS signals and TCK signals to a tested chip, controlling the tested chip to enter the corresponding working state, and receiving TDO signals output by the tested chip; the USB-to-serial-port conversion circuit is used for receiving USB bus signals output by the control platform, converting the USB bus signals into TMS signals and TCK signals in the serial data format and outputting the TMS signals and the TCK signals to the JTAG control circuit and also used for receiving TDO signals in the serial data format output by the JTAG control circuit, converting the TDO signals into the USB bus signals and outputting the USB bus signals to the control platform; the JTAG control circuit is used for receiving TDO signals output by the t