Method for achieving linear shading detection structure of common light dependent resistor

The invention relates to a linear shading detection technology, in particular to a method for achieving a linear shading detection structure of a common light dependent resistor. The bent portions of resistor discs at the two ends of the light dependent resistor are shielded through lightproof insul...

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Bibliographic Details
Main Author YUE ZHIMING
Format Patent
LanguageChinese
English
Published 09.07.2014
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The invention relates to a linear shading detection technology, in particular to a method for achieving a linear shading detection structure of a common light dependent resistor. The bent portions of resistor discs at the two ends of the light dependent resistor are shielded through lightproof insulator materials or coatings, the light dependent resistor and a moving shading plate are arranged to be consistent in direction, when the moving shading plate moves in a right-and-left mode, light reaction linear refraction areas and displacement of different positions of the light dependent resistor are detected, and the difference of light intensity of the light dependent resistor and changes of the resistance value of the light dependent resistor along with the light intensity are detected. The method for achieving the linear shading detection structure of the common light dependent resistor is simple in technology, low in cost and capable of achieving linearization detection and detecting different level conditi
Bibliography:Application Number: CN201310006634