Synchronously resettable scanning structure D trigger resisting single event upset and single event transient

• Main Authors: GUO YANG, LIANG BIN, LIU ZONGLIN, CHI YAQING, HU CHUNMEI, CHEN JIANJUN, WANG YUNFENG, LI ZHENTAO, SUN YONGJIE, CHEN SHUMING
• Format: Patent
• Language: Chinese; English
• Published: 28.05.2014
• Subjects: BASIC ELECTRONIC CIRCUITRY; ELECTRICITY; PULSE TECHNIQUE

The invention discloses a synchronously resettable scanning structure D trigger resisting single event upset and single event transient, so as to solve the problem of poor ability to resist single event upset and single event transient of the synchronously resettable scanning structure D trigger. Ac...