Method for extracting defect time constant through transient current spectrum

The invention discloses a method for extracting a defect time constant through a transient current spectrum. The method comprises the step a of measuring transient response of a GaN HEMT drain current, the step b of conducting nonlinear fitting on the measured transient current, and the step c of es...

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Bibliographic Details
Main Authors FENG FEIFEI, WEI KE, ZHANG HAOXIANG, WANG XINHUA, CHEN XIANGDONG, LIU XINYU, ZHENG YINGKUI, HUANG SEN, WAN YUANTAO
Format Patent
LanguageChinese
English
Published 19.02.2014
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:The invention discloses a method for extracting a defect time constant through a transient current spectrum. The method comprises the step a of measuring transient response of a GaN HEMT drain current, the step b of conducting nonlinear fitting on the measured transient current, and the step c of establishing the relation between the defect time constant and a relative density and determining the defect time constant according to the relative density. The method for extracting the defect time constant through the transient current spectrum is a simplified scheme for solving the problems that an existing method for extracting a defect time constant of a short-grid-length device is high in equipment dependency degree and large in debugging difficulty, and is also used for extracting a defect time constant of a long-grid-length device.
Bibliography:Application Number: CN20131629759