PoF (physics of failure) based method for calculating mission reliability of electronic product

• Main Authors: CHEN YING, LUO MINGZHU, YE CUI, KANG RUI
• Format: Patent
• Language: Chinese; English
• Published: 05.02.2014
• Subjects: CALCULATING; CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TOTRANSPORTATION; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; PHYSICS; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS; TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINSTCLIMATE CHANGE

A PoF based method for calculating mission reliability of an electronic product comprises steps as follows: step one, information of all mission profiles of the product is collected, and an environment profile of each mission is determined; step two, thermal simulation and vibration simulation of environmental stress of each mission are performed, and a local response of the product to an environmental load is obtained; step three, a product simulation model is established; step four, simulation calculation of the product in all the mission profiles is completed, and the mean time to failure and a main failure mechanism of the product are obtained; and step five, the mission reliability of the product is calculated according to the mean time to failure. According to the PoF based method for calculating the mission reliability of the electronic product, all missions of the product during lifetime use are considered, the environmental stress of each mission is simulated, and the mean time to failure and the mis