Method and device for non-contact measuring surfaces

A slit (m) is projected onto an object surface in which reference point (X1) is in a horizontal axis (x) closest to best in focus position (P). One image of a field of view area (F) is acquired after reflection of light comprising said reference point (X1). Position (Z1) of the object (300) in a ver...

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Bibliographic Details
Main Authors LAGUARTA BERTRAN FERRAN, PINTO VILA AGUSTI, CADEVALL ARTIGUES CRISTINA, ARTIGAS PURSALS ROGER
Format Patent
LanguageChinese
English
Published 29.01.2014
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Summary:A slit (m) is projected onto an object surface in which reference point (X1) is in a horizontal axis (x) closest to best in focus position (P). One image of a field of view area (F) is acquired after reflection of light comprising said reference point (X1). Position (Z1) of the object (300) in a vertical axis (z) is determined. Images of respective field of view areas (F) are acquired after reflection of light having reference points (X2, X3... Xn) by simultaneously moving the object (300) along axis (z) to maintain reference points (X2, X3... Xn) closest to best in focus position (P). Positions (Z2, Z3... Zn) in which images were acquired are determined. The best in focus position (P) along horizontal axis (x) is determined for each image. A correction differential (delta 1, delta 2...delta n) between best in focus position (P) and reference points (X1, X2.. Xn) is calculated.
Bibliography:Application Number: CN2011871004