Charge level three-dimensional imaging measurement and control system

• Main Author: LI SHIKAI
• Format: Patent
• Language: Chinese; English
• Published: 25.12.2013
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

The invention relates to a charge level three-dimensional imaging measurement and control system which comprises a measurement device and an industrial personal computer. The measurement device comprises a distance measuring instrument and a two-dimensional scanning mechanism, a radar wave transmitting, receiving and converting circuit is installed on the exterior of the two-dimensional scanning mechanism, and the radar wave transmitting, receiving and converting circuit is connected with the distance measuring instrument. The top of the two-dimensional scanning mechanism is fixedly connected with the top of an outer shell, and an upper fixing block is movably connected with the top of a mechanism supporting frame. The bottom of the mechanism supporting frame is movably connected with an installation frame, the distance measuring instrument is installed on the installation frame, a horn-shaped antenna is arranged in the charge level direction, and the two-dimensional scanning mechanism is connected with the i