X-ray system and method for sampling image data

An X-ray imaging method includes in a digital X-ray detector including an array of discrete picture elements each including a photodiode and a transistor, applying a first voltage to the transistors of the discrete picture elements. The method also includes preparing for acquisition of X-ray image d...

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Bibliographic Details
Main Authors XUE PING, KOST BRIAN JOHN, LIU JAMES ZHENGSHE, LANGLER DONALD FAYETTE, GRANFORS PAUL RICHARD, KUMP KENNETH SCOTT
Format Patent
LanguageChinese
English
Published 18.09.2013
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
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Summary:An X-ray imaging method includes in a digital X-ray detector including an array of discrete picture elements each including a photodiode and a transistor, applying a first voltage to the transistors of the discrete picture elements. The method also includes preparing for acquisition of X-ray image data by sampling data from the discrete picture elements while applying a second voltage to the transistors of the discrete picture elements not then being sampled, the second voltage being more negative than the first voltage. The method further includes receiving X-ray radiation on the detector from a source. The method yet further includes sampling X-ray image data from the discrete picture elements while applying the second voltage to the transistors of the discrete picture elements not then being sampled.
Bibliography:Application Number: CN201280005858